MSE Colloquium
Date: July 15, 2011 from 2:00 pm to 3:00 pm EDT
Location: 214 Mudd
Contact: For further information regarding this event, please contact APAM Department by sending email to or by calling 212-854-4457.
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Thermo-Mechanical Behaviour of Thin Films and Small Structures Characterized by SYNCHROTRON X-ray Diffraction

Jozef Keckes
University of Leoben & Austrian Academy of Science

Several efforts have been made to characterize structural properties and mechanical state of small crystalline volumes. The challenge of the interlinking residual stress state, local microstructure and mechanical properties has been hindered mostly by the spatial resolution of the diffraction techniques and compositional gradients on the nano-scale.

Recently, the application of synchrotron X-ray beams with micron or sub-micron sizes has opened a possibility to perform position resolved and/or in-situ studies of stresses and microstructure with resolution below 100nm. The aim of this presentation is to demonstrate our recent activities in the application of synchrotron XRD at ESRF, BESSY and Hasylab. Following topics will be presented: size effect of yield stresses in small single-crystalline domains analysed using in-situ uLaue diffraction in tension, the use of nano-beams to analyze microstructure, stresses and composition in graded nanostructures, high-temperature X-ray diffraction characterization of residual stresses in thin films and self-hardened coatings.

Host: I.C. Noyan